A55 电磁计量 标准查询与下载

JJG 563-2004 高压电容电桥

High Voltage Capacitance Bridges

JJG 604-2004 铁路轮对内距尺检具

Measure for Gauge for Measuring Distance Between Inside Rim Faces of Railway Wheels

JJG 505-2004 直流比较仪式电位差计

D.C. Comparator Potentiometers

ANSI/ESD SP14.1-20041-2004 系统级静电放电模拟器验证标准

This document defines a time-domain measurement technique for verifying compliance with discharge current specifications given in system-level ESD standards

System Level Electrostatic Discharge (ESD) Simulator Verification Standard

ASTM E684-04 固体表面溅射深度仿形加工用大直径离子束的电流密度近似测定的标准规程

Sputter depth profiling is used in conjunction with Auger electron spectroscopy, x-ray photoelectron spectroscopy, ion scattering spectroscopy, and secondary ion mass spectrometry to determine the chemical composition and atomic concentration as a function of distance from the surface of a specimen. See Guide E 1127. The diameter of the ion beam used for sputtering must be specified and this practice is a relatively quick method of measuring the shape (that is, current density distribution) of the ion beam if a suitable Faraday cup is not available.3 1.1 This practice describes a simple and approximate method for determining the shape and current density of ion beams. The practice is limited to ion beams of diameter greater than 0.5 mm of the type used for sputtering of solid surfaces to obtain sputter depth profiles. It is assumed that the ion-beam current density is symmetrical about the beam axis. 1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Approximate Determination of Current Density of Large-Diameter Ion Beams for Sputter Depth Profiling of Solid Surfaces

ANSI/ESD SP14.1-2004 系统等级静电放电模拟器验证标准

System Level Electrostatic Discharge (ESD) Simulator Verification Standard

JJG 361-2003 脉冲电压表

Pulse Voltmeter

IEEE Std C37.26-2003 低压电感试验电路功率因数的测量方法指南

Describes three methods used in the measurement of the power factor of inductive low-voltage (1000 V and less) test circuits. These methods are: 1) Radio method, 2) dc decrement method, and 3) Phase relationship method.

Guide for methods of power factor measurement for low-voltage inductive test circuits

BS EN 60052:2003 用标准(空)气隙法测量电压

Voltage measurement by means of standard air gaps

DIN EN 60052:2003 标准气隙法测量电压

Voltage measurements by means of standard air gaps (IEC 60052:2002); German version EN 60052:2002

JJG 684-2003 表面铂热电阻

Surface Platinum Resistance Thermometer

JJF 1095-2002 电容器介质损耗测量仪校准规范

Calibration Specification for Capacitor Dielectric Loss Meters

NF C31-888-1:2002 超导电性.第1部分:临界电流测量.铜/铌-钛复合超导体的直流临界电流

Superconductivity - Part 1 : critical current measurement - DC critical current of Cu/Nb-Ti composite superconductors.

JJF 1087-2002 直流大电流测量过程控制技术规范

T.S. for Measurement Control System for Heavy Direct Current

ASTM E1004-02 用电磁(涡流)法测定电导率的标准实施规程

Absolute probe coil methods, when used in conjunction with reference standards of known value, provide a means for determining the electrical conductivity of nonmagnetic materials. Electrical conductivity of a sample can be used as a means of determining: (1) type of metal or alloy, (2) type of heat treatment (for aluminum this evaluation should be used in conjunction with a hardness examination), (3) aging of the alloy, (4) effects of corrosion, and (5) heat damage.1.1 This practice covers a procedure for determining the electrical conductivity of nonmagnetic metals using the electromagnetic (eddy-current) method. The procedure has been written primarily for use with commercially available direct reading electrical conductivity instruments. General purpose eddy-current instruments may also be used for electrical conductivity measurements but will not be addressed in this practice.1.2 This practice is applicable to metals that have either a flat or slightly curved surface and includes metals with or without a thin nonconductive coating.1.3 Eddy-current determinations of electrical conductivity may be used in the sorting of metals with respect to variables such as type of alloy, aging, cold deformation, heat treatment, effects associated with non-uniform heating or overheating, and effects of corrosion. The usefulness of the examinations of these properties is dependent on the amount of electrical conductivity change caused by a change in the specific variable.1.4 Electrical conductivity, when evaluated with eddy-current instruments, is usually expressed as a percentage of the conductivity of the International Annealed Copper Standard (IACS). The conductivity of the Annealed Copper Standard is defined to be 0.58108 S/m (100 % IACS) at 20176;C.1.5 The values stated in SI units are regarded as standard.1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Determining Electrical Conductivity Using the Electromagnetic (Eddy-Current) Method

JJG 490-2002 脉冲信号发生器检定规程

Verification Regulation of Pulse Generators

JJG 970-2002 变压比电桥检定规程

Verification Regulation of Transformers Turn Ratio Test Sets

JJF 1075-2001 钳形电流表校准规范

Calibration Specification of Clamp Ammeters

ANSI C12.1-2001 电测量规范

Establishes acceptable performance criteria for new types of ac watthour meters, demand meters, demand registers, pulse devices, and auxiliary devices. It describes acceptable in-service performance levels for meters and devices used in revenue metering.

Electricity Metering, Code for

JJG 964-2001 毛细管电泳仪检定规程

Verification Regulation of Capillary Electrophoresis Instrument