X射线能谱仪 标准查询与下载
共找到 150 条与 X射线能谱仪 相关的标准，共 10 页
本标准规定了表征以半导体探测器、前置放大器和信号处理系统为基本构成的X射线能谱仪（EDS）特性最重要的量值。本标准仅适用于国态电离作用原理的半导体探测器EDS。本标准只规定了与电子探针（EPMA）或扫描电镜（SEM）联用的此类EDS的最低要求，至于如何实现分析则不在本标准的规定范围之内
Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
Such systems consist of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer
Standard test procedures for semiconductor X-ray energy spectrometers
Standard test procedureds for semiconductor X-ray energy spectrometers
이 표준은 반도체 X-선 에너지 분광계에 대한 표준 시험절차를 제시한다. 해당 계통은 반도
Standard test procedures for semiconductor X-ray energy spectrometers
Standard test procedures for semiconductor X-ray energy spectrometers
Standard test procedures for semiconductor X-ray energy spectrometers
This standard presents standard test procedures for semiconductor X-ray energy spectrometers. Such systems consist of a semiconductor radiation
Standard test procedures for semiconductor X-ray energy spectrometers
Standard test procedures for semiconductor X-ray energy spectrometers
Test procedures for X-ray spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced
IEEE Standard Test Procedures for Semiconductor X-Ray Energy Spectrometers
Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
Replaces one sentence in sub-clause 7.4.1 (page 55) and the Figure 15a (page 94
Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1
本标准规定了半导体X射线探测器系统和半导体X射线能谱仪主要特性的测量方法。 本标准适用于半导体X射线探测器系统和半导体X射线能谱仪主要性能的测量
Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
本标准规定了表征以半导体探测器、前置放大器和信号处理系统为基本构成的X射线能谱仪(EDS)特性最重要的性能参数。本标准仅适用于基于固态电离原理的半导体探测器能谱仪。本标准规定了与扫描电镜(SEM)或电子探针(EPMA)联用的EDS性能参数的最低要求以及核查方法。至于实际分析过程，在ISO 22309
Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
本标准规定了X射线光电子能谱仪的检定方法。本标准适用于使用非单色化Al或Mg X射线或单色化Al X射线，且带有溅射清洁用离子枪的X射线光电子能谱仪的检定
Verification method for X-ray photoelectron spectrometers
What is this standard about? This document is designed to allow the user to assess, on a regular basis, several key parameters of an X-ray
Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
