仪器简介：
Company History
Image Metrology was founded in 1998. Today we are a world wide leading supplier of image processing software for "nano-microscopy".

Our mission is to provide our customers with state-of-the-art image processing software for microscopy including:
Correction tools for creating the most accurate presentation of the "true" surface


Automated analysis techniques assuring high accuracy, quality and cost efficiency


Visualization and reporting tools enabling convincing and impressive communication of results
This mission is fulfilled by development of our main product the Scanning Probe Image Processor, SPIP™. SPIP™ supports a wide variety of microscope types and their file formats including Scanning Probe Microscopes (SPM), interference microscopes, Scanning Electron Microscopes (SEM), confocal microscopes and profilers.

Image Metrology is a highly innovative company constantly developing new solutions meeting the demands from our high-tech customers. Image Metrology is supplying its products directly to the end users or via our distribution network, and having an export rate of 98%.

技术参数：
Over the years, the Scanning Probe Image Processor, SPIP™, has become the de-facto standard for image processing at nanoscale.

SPIP™ is a modular software package offered as a basic module and 14 optional add-ons dedicated to specific purposes.

Whether you are an expert user or new to the field of image analysis, SPIP™ lets you produce the results you need with just a few mouse clicks.

SPIP™ is used for various purposes including Semiconductor Inspection, Physics, Chemistry, Biology, Metrology, and Nano Technology.

SPIP™ currently supports 60 file formats.

The current SPIP™ version is 4.1.6, released 2005-12-13.


主要特点：
OEM Distributors
The following OEM Distributors offer SPIP™ together with new instruments:

A.P.E. Research s.r.l.

ADE Phase Shift

Ambios Technology, Inc.

ATOS GmbH

Danish Micro Engineering A/S

JEOL

L.O.T.-Oriel GmbH & Co. KG

Molecular Imaging

NanoInk, Inc.

NanoMc

Nanonis GmbH

Omicron NanoTechnology GmbH

Omniscan

PSIA Corporation

SII NanoTechnology, Inc.

STIL SA

Surface Imaging Systems (S.I.S.)

Thermo Electron (Karlsruhe) GmbH

Image Metrology扫描探针显微镜图像分析系统信息由上海富格贸易有限公司为您提供，如您想了解更多关于Image Metrology扫描探针显微镜图像分析系统报价、型号、参数等信息，欢迎来电或留言咨询。

注：该产品未在中华人民共和国食品药品监督管理部门申请医疗器械注册和备案，不可用于临床诊断或治疗等相关用途