400-6699-117转1000
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工商注册信息已核实!参考报价: | 面议 | 型号: | 多功能扫描探针显微镜 |
品牌: | 伯英 | 产地: | 北京 |
关注度: | 19 | 信息完整度: | |
样本: | 典型用户: | 暂无 | |
供应商性质 | 生产商 | 产地类别 | 国产 |
400-6699-117转1000
多功能扫描探针显微镜(带纳米力学测试功能)型号:NT-206,是集多功能于一身的原子力显微镜,带有复杂的硬件与软件分析系统,可分析形貌与力学性能,分辨率为纳米级别。可添加:纳米压痕、划痕、磨损,附着力、摩擦力测试,纳米光刻等功能。
A probe is positioned above journal neck of watch gear |
Embedded videosystem in combination with motorized XY micropositioning stage provide convenient tuning of the instrument and its fine targeting onto the features on the sample surface. All that dramatically enhances the instrument's functionality when researching micro- and nanosize objects.
To meet requirements of specific research tasks, AFM NT-206 can include specialized changeable probe holders for microtribometry and adhesiometry or for nanoindentation.
NT-206 ::: Description ::: Features ::: Delivery set ::: Software
多功能扫描探针显微镜(带纳米力学测试功能)技术指标:
Measurement modes: 测量模式:
Motion patterns at the measurements: |
Note. |
Scan field area:扫描面积 | from 5x5 micron up to 50x40 microns |
Maximum range of measured heights:最大高度范围 | from 2 to 4 micron |
Lateral resolution (plane XY):侧面分辨率 | 1–5 nm (depending on sample hardness) |
Vertical resolution (direction Z):竖直分辨率 | 0.1–0.5 nm (depending on sample hardness) |
Scanning matrix:扫描矩阵 | Up to 1024x1024 points |
Scan rate:扫描速度 | 40–250 points per second in X-Y plane |
Nonlinearity correction :非线性校正 | A software nonlinearity correction provided |
Minimum scanning step:最小扫描步阶 | 0.3 nm |
Scanning scheme:扫描步骤 | The sample is moved in X-Y plane (horizontal) and in Z-direction (vertical) under stationary probe. |
Scanner type:扫描器类型 | A piezoceramic tube. |
Cantilevers (probes):悬臂(探针) | Commercial AFM cantilevers of 3.4x1.6x0.4 mm. |
Cantilever deflection detection system:悬臂倾斜探测系统 | Laser beam scheme with four-quadrant position-sensitive photodetector |
Sample size:样品尺寸 | Up to 30x30x8 mm (w–d–h); extending block insert allows measurement of samples with height up to 35 mm |
High voltage amplifier output: 高压放大器输出 | +190 V |
16 bit | |
Operation environment:操作环境 | Open air, 760+40 mm Hg col., T = 22+4°С, relative humidity <70% |
Range of automated movement of measuring head:测量头自动移动范围 | 10x10 mm in XY plane for micropositioning of probe relative measured sample at step 2.5 micron with optical visual monitoring |
Overall dimensions:总尺寸 | Scanning unit: 185x185x290 mm |
Field of view of embedded videosystem:植入视频系统的视场 | 1x0.75 mm, visualization window 640x480 pixel, frame rate up to 30 fps. |
Vibration isolation:防震隔离 | Additional antivibration table is recommended |
Host computer:控制计算机 | Not less than: Celeron® 2.2, RAM 256 MB, HDD 80 GB, VRAM 128 MB, monitor 17" 1024x768x32 bit, Windows® XP SP1, 2 USB port. |
Software:软件 | Special control software SurfaceScan and the AFM image processing package SurfaceView / SurfaceXplorer are included. |
* Before measurements, the probe can be positioned to necessary place over the sample with help of automated motorized stage. To provide monitoring for the scan area and objects below the probe, the instrument embeds a videosystem allowing to watch the probe motion over the sample surface. Videosystem and the motorized stage for the probe positioning over sample are included in base set by default. A combination of these two options allows rather flexible selection of objects to be measured on the sample surface at direct visual monitoring by the opeartor.
多功能扫描探针显微镜(带纳米力学测试功能)组成模块:
DELIVERY SET
NT-206 ::: Description ::: Features ::: Delivery set ::: Software
::: BASIC SET | |||
Scanning unit (atomic force microscope) Includes a base platform with embedded XY positioning stage and a detachable measuring head with integrated video system | |||
Control electronic unit | |||
Software package including: The software runs under Win32. Supplied on CD. Updates available at this site in section ARCHIVE > SOFTWAREAFM control software SurfaceScan for driving complex and data acqusition and visualization .SurfaceView and SurfaceXplorersoftware package for the measured data processing, visualization and analysis.The software can include plug-ins for processing AFM-data obtained with other microscopes.A set of drivers for connection of control electronic unit with host PC and running videosystem. |
伯英科技多功能扫描探针显微镜(带纳米力学测试功能)信息由北京伯英科技有限公司为您提供,如您想了解更多关于伯英科技多功能扫描探针显微镜(带纳米力学测试功能)报价、型号、参数等信息,欢迎来电或留言咨询。
注:该产品未在中华人民共和国食品药品监督管理部门申请医疗器械注册和备案,不可用于临床诊断或治疗等相关用途