APD 2000 PRO 粉末X射线衍射仪

tel: 400-6699-117 转 5566

吉恩纳X射线衍射仪(XRD), APD 2000 PRO 为定性和定量的粉末X射线衍射仪。控制电路精确地反馈，保证了X射线发生器更佳稳定；预设高压和激发......

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X Ray Generator	Maximum Output Power	3 kW (option: 4 kW)
	Output Stability	< 0.01 % (for 10% power supply fluctuation)
	Max Output Voltage	60 kV
	Max Output Current	60 mA (option: 80 mA)
	Voltage Step Width	0.1 kV
	Current Step Width	0.1 mA
	Ripple	0.03% rms < 1kHz, 0.75% rms > 1kHz
	Preheat and Ramp	Automatic preheat and ramp control circuit
	Input Voltage	220 Vac +/-10%, 50 or 60 Hz, single phase
	Size	Width 48.3 cm, height 13.3 cm, depth 56 cm
X-Ray Tube	Type	Glass (option: Ceramic), Cu Anode, Fine Focus (options: any kind of X-Ray tube)
	Focus	0.4 x 12 mm LFF (other options available)
	Max Output	3.0 kW
Goniometer	Configurations	Vertical and Horizontal Theta/2Theta geometry
	Measuring circle diameters	350 - 400 mm
	Vertical Scanning Angular Range	- 60° < 2 Theta < + 168° (according to accessories)
	Horizontal Scanning Angular Range	- 110° < 2 Theta < + 168° (according to accessories)
	Smallest selectable stepsize	0.0001°
	Angular reproducibility	+/- 0.0001°
	Modes of operation	Continuous scan, step scan, theta or 2 theta scan, fast scan, theta axis oscillation
	Variable Divergence slits	0 - 4°
	Variable Anti-Divergence slits	0 - 4°
	Variable Receiver slits	0 - 4°
	Soller slits	2°
Detector	Type	Scintillation counter Nal (options: YAP(Ce); multistrip)
Detector	Countrate	2 x 10(6) cps (Nal); 2 x 10(7) cps (Yap(Ce))
Case	Dimensions	Width 850 mm, heigh 1680 mm, depth 750 mm
Case	Leakage X-rays	< 1 mSv/Year (full safety shielding according to the international guidelines)
Processing Unit	Computer Type	Personal Computer, the latest version
	Items controlled	X-ray generator, goniometer, sample holder, detector, counting chain
	Basic Data Processing	Polynomial least squares smoothing. Fourier smoothing. Search for Peaks (automatic and manual). Spline background subtraction. Single peak analysis (area, FWHM, centroid, background). Marquardt fit (with pseudo-Voigt and Pearson VII curves, Ka2 contribution, weighted sum of squares). Sum and multiply by a constant. Scale normalization. Zoom. Graphical windows. Overlap and comparison of diffractograms. Multiview function. Cursor scan. Creation of graphic files .BMP. ICDD-PDF2 Card Overlap. Creation of calibration curves. Analysis of unknown samples. Qualitative and quantitative phase analysis. Rietveld analysis, crystalline structural analysis, crystallite size and lattice strain, crystallinity calculation