ForceRobot 300全自动力谱机器仪显微镜

样品台移动范围 180*80

样品尺寸 <15

定位检测噪声 500

System specifications

ForceRobot® 300 is available in 2 configurations for sample positioning or mapping utilizing the same head

ForceRobot® 300 MotorizedStage

• Travel range of 2 × 2cm²

• Step Size (Resolution) better than 1 μm

• Repeatability better than 1 μm

ForceRobot® 300 PrecisionMappingStage

• Travel range of 100 × 100 μm² under closed loop control

• Position noise better than 0.3 nm closed loop

Both configurations can be used with inverted research microscopes or as stand-alone systems and work with JPK‘s DirectOverlay™ feature.

ForceRobot® 300 can be operated:

1、On top of an inverted research microscope for Single Molecule Force Spectroscopy (SMFS) simultaneously with Fluorescence Microscopy

• Find a measurement spot optically on your sample by fluorescent labelling

• Combine SMFS with advanced optical techniques such as FCS, FRET, TIRF or optical tweezers

• Exact positioning and overlay of optical and force spectroscopy data with the JPK DirectOverlay™ software module

• Fits to microscope based from

            Zeiss (Axio Observer, AxioVert 200)

           Olympus (IX line)

            Nikon (TE 2000, Ti)

            Leica (DMI line)

2、Stand-alone system

• Maximum flexibility even if no fluorescence is needed (only 1 minute to mount the stage on an optical microscope)

• Free access to the sample area

Highest data quality and output

• 200,000 curves per 24 hours in unattended mode while varying parameters such as temperature or loading rate

• Highest data density with virtually unlimited points per force curve

Automate your measurements

• Intelligent and automated approach for soft landing even with functionalized tips

• User-friendly automated laser and detector alignment eliminates cantilever drift for long term measurements

• Automated sample positioning or mapping with high precision sample stages

• Full remote instrument operation through internet

ForceRobot® 300 head

• Rigid low-noise construction and drift-minimized mechanics based on our proven NanoWizard® design

• Liquid-safe concept with integrated vapour barrier, special encapsulated piezo drives and tip moving design

• Intelligent and automated approach with user defined parameters for different experiments

• Automated laser and detector alignment for long term experiments

• IR detection light source with low coherence

• High detector bandwidth of 8 MHz for high speed signal capture

• 980 nm wavelength detection light source for undisturbed fluorescence or Raman experiments

• Built-in optical filters for fluorescence without crosstalk with the beam deflection detection

• Built-in CCD camera for viewing the probe and sample

• High-speed flexure stage with ultrafast z-response and closed loop control

• Piezo options:

            6.5 μm z-range with fast response

           15 μm z-range for long pulling ranges (optional)

• Z-sensor noise level: 0.06 nm RMS at 0.1-1 kHz bandwidth

• Laser safety class 1

Control electronics

• 4 high speed 16 bit ADCs with 60 MHz

• High-speed data capture with optional burst mode

• Modular analog and digital design with latest PPC technology (PowerPC @ 660 MHz)

• Discrete analog high-speed high voltage amplifiers

• Gigabit Ethernet interface for fast data link

• Number of data points that can be captured continuously: restricted only by HDD

• Thermal noise acquisition up to 3.25 MHz

• connectors for maximum experimental freedom

SPMControl software

• Fully automated data acquisition

• Highest density of data points per force curve

• Fully automated sensitivity and spring constant calibration

• Automated re-calibration and cantilever drift compensation

• JPK ExperimentPlanner™ for designing a dedicated measurement workflow

• JPK RampDesigner™ for custom designed force curve segments

• Advanced spectroscopy modes such as

          Various force clamp modes

              User-defined temperature ramps, pulling speed or force feedback

• Enhanced force mapping capabilities

• Automated online and offline advanced filtering of curves, based on multiple criteria e.g. force, length and loading rate ranges

• Powerful batch processing including WLC, FJC, step fitting and other analysis

• JPK‘s DirectOverlay™ feature as an option

• Molecular recognition mapping

Integrated flexibility from the widest range of accessories in the market

• Sample stages for all major inverted optical microscope manufactures such as Zeiss, Nikon, Olympus and Leica

• JPK FluidicsModule™ with up to 8 different liquids such as buffer solutions

• Fluid cells and temperature control options for measurements from -120°C up to 300°C

• JPK‘s ForceWheel accessory for most sensitive experiment control

• Vibration and acoustic isolation from leading suppliers