技术参数:
测量系统
测量头部 AFM和STM测量头全内置、全自动切换
可选配液相模式和纳米压痕测量头
zei大样品尺寸 Up to 20 mm in diameter; up to 10 mm in height
直径20mm,厚度10mm
Sample weight
zei大样品重量 Up to 100 g
100g
XY sample positioning
XY样品定位装置 5x5 mm, motorized, video monitored
移动范围5X5mm,软件控制电动定位
Minimum XY sample positioner step
XY样品定位装置zei小步进 0.3 μm
Scanning field
扫描范围 100x100x10 μm with closed-loop sensors;
100X100X10um,三维全量程闭环控制扫描器
3x3x2 μm in the low voltage mode
3x3x2 μm,低电流模式扫描器
Nonlinearity, XY
XY方向非线性度 <=0.1 % (with closed-loop sensors)
<=0.1 % (闭环控制扫描器)
Noise level Z (RMS in the bandwidth of 10–1000 Hz)
Z方向噪音水平(带宽10~1000Hz时的RMS值) 0.03 nm (typically), 0.04 nm (maximum) — with closed-loop sensors; 0.02 nm in the low voltage mode
闭环控制扫描器,典型值0.03nm,zei大0.04nm
低电流模式扫描器,0.02nm
Optical system for cantilever deviation registration
激光光路系统 Motorized, automated system alignment
电动调节,全自动准直
Video monitoring system
视频显微镜系统 Motorized continuous zooming, focusing, sample location positioning, resolution 2 μm
软件控制电动变焦和连续变倍,软件控制变换视野,分辨率2um
Temperature control of the sample
样品温度控制 Room temperature up to 150°C
室温~150°C
扫描探针/原子力显微镜SPM/AFM
售后服务
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