Since late 1980s, the whole-cell patch-clamp technique has been used as a powerful tool for analyzing local circuits of the central nervous system in a brain slice preparation in which the fundamental architecture of local circuits is mostly maintained. When combined with intracellular staining techniques, the technique allows high-resolution analysis of the membrane and the synaptic and morphological properties of the recorded cells. We offer a brief introduction to slice patch-clamp recording, including acute slice preparation, selection of intracellular and extracellular solutions, techniques for forming giga-ohm seals and whole-cell recordings, and staining of the recorded neurons. Much effort has gone into describing a number of small but important technical issues that can be useful for beginners attempting this technique.