原子力显微镜（AFM）应用举例
1, Lateral Force Microscopy 测量样品表面的摩擦力。
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2, 活体细胞测量<img src="https://pic1.zhimg.com/50/df873a6d049bb1073001013b7a230272_hd.jpg" data-rawwidth="501" data-rawheight="434" class="origin_image zh-lightbox-thumb" width="501" data-original="https://pic1.zhimg.com/df873a6d049bb1073001013b7a230272_r.jpg">
3, chemical force microscopy 测量两个化合物之间的作用力。
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4, quantitative nanomechanical 测量样品的形貌、模量、表面粘滞力、能量损失和形变量。
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5, electric force microscopy 测量样品表面带电的电荷强度，或者说保有电荷的能力。
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6, surface potential imaging 测量样品的表面电势，或者说电子溢出金属的难易程度。
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7, Piezo Response microscopy 压电力响应。
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8, conductive AFM 测量样品的导电性质，测量样品的电阻。
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9, scanning capacitance microscopy 扫描电容，测试样品中的载流子密度。
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10, scanning spreading resistance microscopy 扩散电阻。
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