IEC PAS 62204:2000由SCC 发布于 ICS Code(s): 31.080.01。
IEC PAS 62204:2000 的最新版本是哪一版?
最新版本是 IEC PAS 62204:2000 。
Aims at determining the temperature coefficient of resistance (at a given reference temperature) of aluminium and aluminium-alloy thin-film metallization that are used in microelectronic circuits and devices. This method is intended for estimating a mean temperature of a metallization line stressed in an accelerated electromigration stress test before any irreversible change in resistivity occurs due to the current-density and temperature stresses imposed.
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