BS ISO 11505:2012

Surface chemical analysis. General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry

2013-01

 

 

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标准号
BS ISO 11505:2012
发布
2013年
发布单位
英国标准学会
替代标准
BS ISO 11505:2013
当前最新
BS ISO 11505:2013
 
 
适用范围
1   Scope This International Standard describes a glow discharge optical emission spectrometric (GD-OES) method for the determination of the thickness, mass per unit area and chemical composition of surface layer films. It is limited to a description of general procedures of quantification of GD-OES and is not applicable directly for the quantification of individual materials having various thicknesses and elements to be determined. NOTE Any individual standard for a test material will have to specify a scope of a thickness of the surface layer as well as analyte elements, and include results of interlaboratory tests for validation of the methods.

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