IEEE PC62.59/D3, September 2018

IEEE Draft Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes


 

 

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标准号
IEEE PC62.59/D3, September 2018
发布
2019年
发布单位
美国电气电子工程师学会
 
 
适用范围
The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges are defined in this standard. It is intended that this standard be used for the harmonization of existing or future specifications issued by PN diode surge protective component manufacturers, telecommunication equipment manufactur...

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