Semiconductor devices - Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
What is BS IEC 60747 ‑ 14 ‑ 11 about?
BS IEC 60747 ‑ 14 ‑ 11 is the 14th part of the multi-series European standard that defines the terms, definitions, configuration, and test methods that can be used to evaluate and determine the performance characteristics of surface acoustic wave-based semiconductor sensors integrated with ultraviolet, illuminance, and temperature sensors.
The measurement methods described in BS IEC 60747 ‑ 14 ‑ 11 are for DC characteristics and RF characteristics, and the measurement method for RF characteristics includes a direct mode and differential amplifier mode based on feedback oscillation.
Note: This BS IEC 60747 ‑ 14 ‑ 11 excludes devices dealt with by TC 49: piezoelectric, dielectric, and electrostatic devices and associated materials...