VDE 0847-22-1-2012
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions (IEC 47A/888/CD:2012)

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions (IEC 47A/888/CD:2012)

2016-08

标准号
VDE 0847-22-1-2012
发布
2012年
发布单位
VDE - VDE Verlag GmbH@ Berlin@ Germany
替代标准
VDE 0847-22-1-2016
当前最新
VDE 0847-22-1-2016
 
 

VDE 0847-22-1-2012相似标准

VDE 0847-21-1-2017 Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions (IEC 47A/1022/CD:2017) VDE 0847-28-1-2017 Integrated Circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions (IEC 47A/995/CD:2016) VDE 0847-22-1-2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions (IEC 62132-1:2015); German version EN 62132-1:2016 VDE 0847-22-8-2013 Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method (IEC 62132-8:2012); German version EN 62132-8:2012 VDE V 0847-22-9-2015 Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method (IEC/TS 62132-9:2014)

推荐

.-1

A MEMS electromagnetic optical scanner for a laser scanning microscope integrated sensing coil for deflection angle measurement [9], but the scanner is one-dimensional and the induced electromotive...

EMC Antenna Parameters and Their Relationships（一）

For radiated immunity or susceptibility measurements, it is the TAF.These two parameters are illustrated in Figure 1....


Copyright ©2007-2022 ANTPEDIA, All Rights Reserved
京ICP备07018254号 京公网安备1101085018 电信与信息服务业务经营许可证：京ICP证110310号