IEC 61000-4-4:2004+AMD1:2010 CSV


 

 

非常抱歉,我们暂时无法提供预览,您可以试试: 免费下载 IEC 61000-4-4:2004+AMD1:2010 CSV 前三页,或者稍后再访问。

您也可以尝试购买此标准,
点击右侧 “立即购买” 按钮开始采购(由第三方提供)。

 

标准号
IEC 61000-4-4:2004+AMD1:2010 CSV
发布
1970年
发布单位
SCC
替代标准
IEC 61000-4-4:2011
当前最新
IEC 61000-4-4:2012 RLV
 
 
被代替标准
en
适用范围
IEC 61000-4-4:2004+A1:2010 Establishes a common and reproducible reference for evaluating the immunity of electrical and electronic equipment when subjected to electrical fast transient/bursts on supply, signal, control and earth ports. The test method documented in this part of IEC 61000-4 describes a consistent method to assess the immunity of an equipment or system against a defined phenomenon. The standard defines: - test voltage waveform; - range of test levels; - test equipment; - verification procedures of test equipment; - test set-up; - test procedure. The standard gives specifications for laboratory and post-installation tests. The contents of the corrigenda of August 2006 and June 2007 have been included in this copy. This consolidated version consists of the second edition (2004) and its amendment 1 (2010). Therefore, no need to order amendment in addition to this publication.

IEC 61000-4-4:2004+AMD1:2010 CSV相似标准





Copyright ©2007-2022 ANTPEDIA, All Rights Reserved
京ICP备07018254号 京公网安备1101085018 电信与信息服务业务经营许可证:京ICP证110310号