IEEE P1687/D1.71, March 2014

IEEE Approved Draft Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

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标准号

IEEE P1687/D1.71, March 2014

发布

2014年

发布单位

美国电气电子工程师学会

 

 

适用范围

This standard describes a methodology for accessing instrumentation embedded within a semiconductor device without defining the instruments or their features themselves, via the IEEE 1149.1 Test Access Port (TAP) and/or other signals. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware description language ...

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