This part of IEC 60749 covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures. This test is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only. In general, this test of low air pressure is in conformity with IEC 60068-2-13 but, due to specific requirements of semiconductors, the clauses of this standard apply.