UNE-EN ISO 10322-2:2016
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices (Endorsed by AENOR in December of 2016.)
- 标准号
- UNE-EN ISO 10322-2:2016
- 发布
- 2016年
- 发布单位
- ES-UNE
- 当前最新
- UNE-EN ISO 10322-2:2016