IEEE Std 301-1969*ANSI N42.2-1969

IEEE Test Procedures for Amplifiers and Preamplifiers for Semiconductor Radiation Detectors (For Ionizing Radiation)

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标准号

IEEE Std 301-1969*ANSI N42.2-1969

发布

1968年

发布单位

美国电气电子工程师学会

替代标准

IEEE Std 301-1976

当前最新

IEEE Std 301-1988

 

 

适用范围

Semiconductor radiation detectors have come into widespread use in recent years for detection of ionizing radiation. Both silicon and germanium detectors have been developed with silicon finding its principal application in the detection and analysis of heavy charged particles. Germanium detectors with their relatively high atomic number (as compared with silicon) and with large sensitive volumes ...

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