IEC 60068-2-10:1968 Basic environmental testing procedures for electronic components and electronic equipment – Part 2: Tests – Test J: Mould growth (Edition 3.0)
Essais fondamentaux climatiques et de robustesse mécanique applicables aux matériels électroniques et a jeurs composants Deuxlème partie: Essais - Essai J: Moisissures (Edition 3.0)
Object To assess the extent of mould growth by a short exposure of 28 days 01 to assess the effect of mould growth on the functioning of the specimen by a longer exposure of 84 days. Note ?C Components would normally be exposed for 28 days and the longer test would usually apply equipemnts.