IEC 62860:2013*IEEE Std 1620:2008

IEC/IEEE Test methods for the characterization of organic transistors and materials


 

 

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标准号
IEC 62860:2013*IEEE Std 1620:2008
发布
2013年
发布单位
美国电气电子工程师学会
当前最新
IEC 62860:2013*IEEE Std 1620:2008
 
 
适用范围
Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particu...

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