IEEE Std 1149.7-2022

IEEE Standard for Reduced-Pin and Enhanced-Functionality Test Access Port and Boundary-Scan Architecture

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标准号

IEEE Std 1149.7-2022

发布

2022年

发布单位

美国电气电子工程师学会

当前最新

IEEE Std 1149.7-2022

 

 

适用范围

Circuitry that may be added to an integrated circuit to provide access to on-chip Test Access Ports (TAPs) specified by IEEE Std 1149.1 is described in this standard. The circuitry uses IEEE Std 1149.1 as its foundation, providing complete backward compatibility, while aggressively adding features to support test and applications debug. It defines six classes of IEEE 1149.7 Test Access Ports (TAP....

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