EN ISO 9220:2022
金属覆盖层.镀层厚度测量.扫描电子显微镜法

Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)

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标准号

EN ISO 9220:2022

发布

2022年

发布单位

欧洲标准化委员会

当前最新

EN ISO 9220:2022

 

 

适用范围

This document specifies a destructive method for the measurement of the local thickness of metallic and other inorganic coatings by examination of cross-sections with a scanning electron microscope (SEM). The method is applicable for thicknesses up to several millimetres, but for such thick coatings it is usually more practical to use a light microscope (see ISO 1463). The lower thickness limit depends on the achieved measurement uncertainty (see Clause 10). NOTE The method can also be used for organic layers when they are neither damaged by the preparation of the cross-section nor by the electron beam during imaging.

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