ISO/TS 13762-2001
粒度分析 小角度X射线溅射法

Particle size analysis - Small angle X-ray scattering method

ISO/TS 13762-2001 发布历史

This Technical Specification specifies the method for determining particle size distribution of ultra-fine powders by the small angle X-ray scattering technique. It is applicable to particle sizes ranging from 1 nm to 300 nm. In the data analysis, it is assumed that particles are isotropic and spherically shaped. The method described in this Technical Specification is also applicable to particle suspensions. This Technical Specification does not apply to: a) powders containing particles whose morphology is far from spherical, except by special agreement; b) powders consisting of porous particles; c) mixtures of powders.

ISO/TS 13762-2001由国际标准化组织 IX-ISO 发布于 2001-03。

ISO/TS 13762-2001 在中国标准分类中归属于: N50 物质成份分析仪器与环境监测仪器综合，在国际标准分类中归属于: 19.120 粒度分析、筛分。

ISO/TS 13762-2001的历代版本如下：

• 2001年03月 ISO/TS 13762-2001 粒度分析 小角度X射线溅射法

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标准号

ISO/TS 13762-2001

发布日期

2001年03月

实施日期

废止日期

无

中国标准分类号

N50

国际标准分类号

19.120

发布单位

IX-ISO

适用范围

This Technical Specification specifies the method for determining particle size distribution of ultra-fine powders by the small angle X-ray scattering technique. It is applicable to particle sizes ranging from 1 nm to 300 nm. In the data analysis, it is assumed that particles are isotropic and spherically shaped. The method described in this Technical Specification is also applicable to particle suspensions. This Technical Specification does not apply to: a) powders containing particles whose morphology is far from spherical, except by special agreement; b) powders consisting of porous particles; c) mixtures of powders.