Conventional attribute sampling plans based upon nonzero acceptance numbers are no longer desirable.In addition, emphasis is now placed on the quality level that is received by the customer. This relates directly to the Lot Tolerance Percent Defective (LTPD) value or the Limiting Quality Protection of MTLSTD-105. Measuring quality levels in percent nonconforming, although not incorrect, has been replaced with quality levels measured in parts per million (PPM). As a result, this standard addresses the need for sampling plans that can augment MIGSTD-105, are based upon a zero acceptance number, and address quality (nonconformance) levels in the parts per million range. This document does not address minor nonconformances, which are defined as nonconformances that are not likely to reduce materially the usability of the unit of product for its intended purpose.
GEIA EIA-584-1991由政府电子与信息技术协会(US-GEIA改名为US-TECHAMERICA) US-GEIA 发布于 1991-06-01。
GEIA EIA-584-1991 在中国标准分类中归属于: L72 数据元表示方法,在国际标准分类中归属于: 17.080 时间、速度、加速度、角速度的测量。
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