(From JEDEC Council Ballot JCB-87-46, formulated under the
cognizance of JC44 Committee on Semicustom Integrated Circuits.)
The concern most often voiced by Application Specific
integrated Circuit (ASIC) users is that of testability. Many
vendors have taken steps to try to minimize the concerns of their
customers but, to date, each company has instituted its own
policies and the customers have seen little to ease their
confusion. This document is composed of inputs from many IC
manufacturers and some IC users. It is intended to bring together
a coherent approach to dcsigriing for testability. It is not
intended as a specification, nor is it to be interpreted as the
only way to design. It should, rather, be used as guidance (as .
the title implies) when designs are being initiated.