ITU-T O.172-2005
基于同步数字系列(SDH)数字系统的抖动和偏移测量设备
Jitter and Wander Measuring Equipment for Digital Systems which are Based on the Synchronous Digital Hierarchy (SDH) Study Group 4; Covering Note: Erratum: 10/2005
ITU-T O.172-2005 中，可能用到以下仪器设备
- 标准号
- ITU-T O.172-2005
- 发布日期
- 2005年04月01日
- 实施日期
- 废止日期
- 无
- 中国标准分类号
- M15
- 国际标准分类号
- 33.060.80
- 发布单位
- IX-ITU
- 引用标准
- ITU-T G.691-2003 ITU-T G.693-2005 ITU-T G.703-2001 ITU-T G.707/Y.1322-2003 ITU-T G.772-1993 ITU-T G.783-2004 ITU-T G.810-1996 ITU-T G.811-1997 ITU-T G.812-2004 ITU-T G.813-2003 ITU-T G.823-2000 ITU-T G.824-2000 ITU-T G.825-2000 ITU-T G.957-1999 ITU-T G.79
- 适用范围
- This Recommendation specifies test instrumentation that is used to generate and measure timing jitter and synchronization wander in digital systems based on the Synchronous Digital Hierarchy (SDH). This Recommendation also specifies requirements for the measurement of SDH tributaries operating at PDH bit rates. The test instrumentation consists principally of a jitter/wander measurement function and a jitter/wander generation function. Measurements can be performed at the physical layer of SDH systems. A bit-error rate test set may also be required for certain types of measurements; this may be part of the same instrumentation or it may be physically separate. Test instrumentation for the generation and measurement of jitter and wander in digital systems based on the Plesiochronous Digital Hierarchy (PDH) is specified in ITU-T Rec. O.171 [18]. It is recommended that ITU-T Recs G.783 [6], G.812 [9], G.813 [10], G.825 [13] and G.798 [15] be read in conjunction with this Recommendation.