DLA SMD-5962-96621 REV E-2005
抗辐射互补金属氧化物半导体与非硅单片电路数字微电路

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, CMOS, NAND GATES, MONOLITHIC SILICON


 

 

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标准号
DLA SMD-5962-96621 REV E-2005
发布日期
2005年09月07日
实施日期
废止日期
中国标准分类号
L56
国际标准分类号
31.200
发布单位
US-DLA
适用范围
This drawing documents three product assurance class levels consisting of high reliability (device classes Q andM), space application (device class V) and for appropriate satellite and similar applications (device class T). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice ofRadiation Hardness Assurance (RHA) levels is reflected in the PIN. For device class T, the user is encouraged to review the manufacturer’s Quality Management (QM) plan as part of their evaluation of these parts and their acceptability in the intended application.




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