BS DD ISO/TS 13762-2002
粒径分析.小角度X射线散射法

Particle size analysis - Small angle X-ray scattering method


 

 

非常抱歉,我们暂时无法提供预览,您可以试试: 免费下载 BS DD ISO/TS 13762-2002 前三页,或者稍后再访问。

如果您需要购买此标准的全文,请联系:

点击下载后,生成下载文件时间比较长,请耐心等待......

 

标准号
BS DD ISO/TS 13762-2002
发布日期
2002年12月04日
实施日期
2002年12月04日
废止日期
中国标准分类号
N50
国际标准分类号
19.120
发布单位
GB-BSI
适用范围
This Technical Specification specifies the method for determining particle size distribution of ultra-fine powders by the small angle X-ray scattering technique. It is applicable to particle sizes ranging from 1 nm to 300 nm. In the data analysis, it is assumed that particles are isotropic and spherically shaped. The method described in this Technical Specification is also applicable to particle suspensions. This Technical Specification does not apply to: a) powders containing particles whose morphology is far from spherical, except by special agreement; b) powders consisting of porous particles; c) mixtures of powders.




Copyright ©2007-2022 ANTPEDIA, All Rights Reserved
京ICP备07018254号 京公网安备1101085018 电信与信息服务业务经营许可证:京ICP证110310号