ASTM E2444-2005
与反射薄膜上测量的相关术语

Terminology Relating to Measurements Taken on Thin, Reflecting Films

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标准号

ASTM E2444-2005

发布日期

2005年

实施日期

废止日期

无

中国标准分类号

A42

国际标准分类号

01.040.31 (Electronics (Vocabularies)); 31.240 (Me

发布单位

US-ASTM

适用范围

1.1 This standard consists of terms and definitions pertaining to measurements taken on thin, reflecting films, such as found in microelectromechanical systems (MEMS) materials. In particular, the terms are related to the standards in Section , which were generated by Committee E08 on Fatigue and Fracture. Terminology E 1823 Relating to Fatigue and Fracture Testing is applicable to this standard.

1.2 The terms are listed in alphabetical order.