IEC TS 62396-2:2008
电子设备的过程管理.大气辐射效应.第2部分:电子设备系统的单一作用效应测试指南

Process management for avionics - Atmosperic radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

作废

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标准号

IEC TS 62396-2:2008

发布

2008年

发布单位

国际电工委员会

当前最新

IEC TS 62396-2:2008

 

 

适用范围

The purpose of this technical specification is to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

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