AS ISO 18118-2006 表面化学分析.俄歇电子能谱法和X射线光电子光谱法.均质材料定量分析中实验测定的相对灵敏系数使用指南
Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Adopts ISO 18118:2004 to give guidance on the measurement and use of experimentally determined relative sensitivity factors for quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy.