IEC 60749-29:2011
半导体器件.机械和气候试验方法.第29部分:闭锁试验

Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test

标准号

IEC 60749-29:2011

发布

2011年

发布单位

国际电工委员会

当前最新

IEC 60749-29:2011

 

 

被代替标准

IEC 47/2083/FDIS:2011 IEC 60749-29:2003

适用范围

"Scope and object This part of IEC 60749 covers the I-test and the overvoltage latch-up testing of integrated circuits. This test is classified as destructive. The purpose of this test is to establish a method for determining integrated circuit (IC) latchup characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing ""no trouble found"" (NTF) and ""electrical overstress"" (EOS) failures due to latch-up. This test method is primarily applicable to CMOS devices. Applicability to other technologies must be established. The classification of latch-up as a function of temperature is defined in 3.1 and the failure level criteria are defined in 3.2"

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