IEC 61788-15:2011
超导性.第15部分:电子特性测量.微波频率下超导薄膜的固有表面阻抗

Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies

标准号

IEC 61788-15:2011

发布

2011年

发布单位

国际电工委员会

当前最新

IEC 61788-15:2011

 

 

被代替标准

IEC 90/280/FDIS:2011

适用范围

This part of IEC 61788 describes measurements of the intrinsic surface impedance (ZS) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method [13@ 14]2. The object of measurement is to obtain the temperature dependence of the intrinsic ZS at the resonant frequency f0. The frequency and thickness range and the measurement resolution for the intrinsic ZS of HTS films are as follows: ? frequency: up to 40 GHz; ? film thickness: greater than 50 nm; ? measurement resolution: 0@01 m?? at 10 GHz. The intrinsic ZS data at the measured frequency@ and that scaled to 10 GHz@ assuming the f2 rule for the intrinsic surface resistance RS (f less-than40 GHz) and the f rule for the intrinsic surface reactance XS for comparison@ shall be reported. 2 Numerals in square brackets refer to the Bibliography.

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