This Technical Specification provides methods for the determination of residual elements other than carbon in samples of single-wall carbon nanotubes (SWCNTs) and multiwall carbon nanotubes (MWCNTs) using inductively coupled plasma mass spectrometry (ICP-MS).The purpose of this Technical Specification is to provide optimized digestion and preparation procedures for SWCNT and MWCNT samples in order to enable accurate and quantitative determinations of elemental impurities using ICP-MS.