This part of IEC 61000 provides a basic description of the methods and means (e.g., instrumentation) for measuring responses arising from highpower transient electromagnetic parameters. These responses can include: the electric (E) and/or magnetic (H) fields (e.g., incident fields or incident plus scatteredfields within a system under test); the current I (e.g., induced by a transient field or within a system under test); the voltage V (e.g., induced by a transient field or within a system under test); the charge Q induced on a cable or other conductor.NOTE The charge Q on the conductor is a fundamental quantity that can be defined at any frequency. The vol