IEC TS 62607-6-4:2016
纳米制造. 关键控制特性. 第6-4部分: 石墨稀. 利用谐振腔的表面电导测量

Nanomanufacturing - Key control characteristics - Part 6-4: Graphene - Surface conductance measurement using resonant cavity

标准号

IEC TS 62607-6-4:2016

发布

2016年

发布单位

国际电工委员会

当前最新

IEC TS 62607-6-4:2016

 

 

引用标准

IEC 60153-2:2016

被代替标准

IEC 113/295/DTS:2015

适用范围

This part of IEC 62607 establishes a method for determining the surface conductance of two- dimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite [3]. The measurements are made in an air filled standard R100 rectangular waveguide configuration, at one of the resonant frequency modes, typically at 7 GHz [4]. Surface conductance measurement by resonant cavity involves monitoring the resonant frequency shift and change in the quality factor before and after insertion of the specimen into the cavity in a quantitative correlation with the specimen surface area. This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimension is uniform over the specimen area.

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