This document describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules. This document does not purport to address causes of electrostatic discharge or to establish pass or fail levels for bypass diode devices. It is the responsibility of the user to assess the ESD exposure level for their particular circumstances. The data generated by this procedure may support qualification of new design types, quality control for incoming material, and/or identify the need for additional ESD controls in the manufacturing process. Finally, this document does not apply to large energy surge events such as direct or indirect lightning exposure, utility capacitor bank switching events, or the like.