GB/T 34986-2017
Methods for product accelerated testing (English Version)

GB/T 34986-2017
Standard No.
GB/T 34986-2017
Language
Chinese, Available in English version
Release Date
2017
Published By
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
Latest
GB/T 34986-2017
Scope
This standard provides guidance for the application of various accelerated test techniques, which are used to evaluate or improve the reliability of products, and to discover and reduce possible failure modes that may occur during the use of products, which is an effective way to ensure product reliability. The purpose of the accelerated test method is to find out the potential design weak link of the product in a short time, provide the reliability information of the product, and realize the necessary reliability/availability growth of the product. This standard addresses accelerated testing of repairable and non-repairable systems. This method can be applied to probability ratio sequential tests, timed censored tests, and reliability growth/improvement tests, where the measured values of reliability human nature may be different from the standard probability values of product failure. This standard also further introduces the accelerated test or product screening method, which is used to identify product defects caused by the manufacturing process that may harm the reliability of the product. The product is caused by manufacturing errors and human defects that may endanger its reliability.

GB/T 34986-2017 Referenced Document

  • IEC 60300-3-1:2003 Dependability management - Part 3-1: Application guide; Analysis techniques for dependability; Guide on methodology
  • IEC 60300-3-5 Dependability management - Part 3-5: Application guide; Reliability test conditions and statistical test principles
  • IEC 60605-2 Equipment reliability testing - Part 2: Design of test cycles
  • IEC 61014:2003 Programmes for reliability growth
  • IEC 61124:2012 Reliability testing - Compliance tests for constant failure rate and constant failure intensity
  • IEC 61163-2 Reliability stress screening - Part 2: Components*2020-03-11 Update
  • IEC 61164:2004 Reliability growth - Statistical test and estimation methods
  • IEC 61649:2008 Weibull analysis
  • IEC 61709 Electric components - Reliability - Reference conditions for failure rates and stress models for conversion
  • IEC 61710 Power law model.Goodness-of-fit tests and estimation methods
  • IEC 62303 Radiation protection instrumentation - Equipment for monitoring of airborne tritium
  • IEC 62429 Reliability growth - Stress testing for early failures in unique complex systems

GB/T 34986-2017 history




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