GB/T 8760-2020
Test method for dislocation density of monocrystal gallium arsenide

Standard No.

GB/T 8760-2020

Language

Chinese

Release Date

2020

Published By

国家市场监督管理总局、中国国家标准化管理委员会

Lastest

GB/T 8760-2020

Replace

GB/T 8760-2006

Scope

This standard specifies the test method for the single-grade dislocation density of zinc arsenide. This standard is applicable to the test of the single dislocation density of front arsenide on the 4100 and (111) planes, and the test range is from 0 cm to 100 000 cm".

GB/T 8760-2020 Referenced Document

• GB/T 14264 Semiconductor materials-Terms and definitions

GB/T 8760-2020 history

• 2020 GB/T 8760-2020 Test method for dislocation density of monocrystal gallium arsenide
• 2006 GB/T 8760-2006 Gallium arsenide single crystal-determination of dislocation density
• 1988 GB/T 8760-1988 Gallium arsenide single crystal--Determination of dislocation density