GB/T 35306-2017
Test method for carbon and oxygen content of single crystal silicon—Low temperature fourier transform infrared spectrometry

Standard No.
GB/T 35306-2017
Language
Chinese
Release Date
2017
Published By
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会
Lastest
GB/T 35306-2017

GB/T 35306-2017 history

  • 2017 GB/T 35306-2017 Test method for carbon and oxygen content of single crystal silicon—Low temperature fourier transform infrared spectrometry



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