This standard specifies the method for the determination of silicon content in tantalum. This standard applies to the determination of the silicon content in tantalum, and also applies to the determination of the silicon content in its hydroxide. Measuring range: 0.0005% to 0.07%.
GB/T 15076.6-1994 history
2020GB/T 15076.6-2020 Methods for chemical analysis of tantalum and niobium—Part 6:Determination of silicon content—Inductively coupled plasma atomic emission spectrometry
1994GB/T 15076.6-1994 Methods for chemical analysis of tantalum and niobium-Determination of silicon content in tantalum