GB/T 5965-2000 (English Version) Semiconductor devices-Integrated circuits-Part 2: Digital integrated circuits-Section one-Blank detail specification for bipolar monolithic digital integrated circuit gates( excluding uncommitted logic arrays)

Standard No.: GB/T 5965-2000
Language: Chinese, Available in English version
Release Date: 2000
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest: GB/T 5965-2000
Replace: GB/T 5965-1986

Scope: The IEC electronic component quality assessment system follows the IEC regulations and works under the authorization of the IEC. The purpose of the system is to define a quality assessment procedure in such a way that electronic components released by a participating country in accordance with the relevant specifications are accepted equally by all other participating countries without further testing. This blank detail specification is one of a series of blank detail specifications for semiconductor devices and is used together with the following standards. IEC 747-10/QC 700000 Semiconductor devices Part 10: Information required by the general specification for discrete devices and integrated circuits.

GB/T 5965-2000 history

2000 GB/T 5965-2000 Semiconductor devices-Integrated circuits-Part 2: Digital integrated circuits-Section one-Blank detail specification for bipolar monolithic digital integrated circuit gates( excluding uncommitted logic arrays)
0000年 GB/T 5965-1986