GB/T 18032-2000
The inspecting method of AB microscopic defect in gallium arsenide single crystal (English Version)

Standard No.

GB/T 18032-2000

Language

Chinese, Available in English version

Release Date

2000

Published By

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China

Latest

GB/T 18032-2000

Scope

This standard specifies the inspection method for gallium arsenide single crystal AB micro-defects. This standard applies to the inspection of GaAs single crystal AB micro-defect density (AB-EPD). The inspection surface is (100) surface. Measuring range is less than 5 X 10 cm

GB/T 18032-2000 history

• 2000 GB/T 18032-2000 The inspecting method of AB microscopic defect in gallium arsenide single crystal