This standard specifies the measurement methods for the main characteristics of semiconductor X-ray detector systems and semiconductor X-ray energy spectrometers. This standard applies to the measurement of the main performance of semiconductor X-ray detector systems and semiconductor X-ray energy spectrometers.
GB/T 11685-2003 history
2003GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers