GB/T 19403.1-2003
Semiconductor Devices Integrated Circuits Part11:Section 1:Internal visual examination for semiconductor integrated circuits(excluding hybrid circuits) (English Version)
- Standard No.
- GB/T 19403.1-2003
- Language
- Chinese, Available in English version
- Release Date
- 2003
- Published By
- General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
- Latest
- GB/T 19403.1-2003
- Scope
- The purpose of internal visual inspection is to inspect the internal materials, structure and process of the integrated circuit, and to verify the consistency with the applicable specification requirements. Typically 100% internal visual inspection of the device should be performed prior to capping or sealing. To find internal defects that may cause the device to fail in normal use and reject the corresponding device. This test may also be used on a sampling basis prior to capping to determine the effectiveness of the manufacturer's quality control and operating procedures for semiconductor devices.
GB/T 19403.1-2003 history
- 2003 GB/T 19403.1-2003 Semiconductor Devices Integrated Circuits Part11:Section 1:Internal visual examination for semiconductor integrated circuits(excluding hybrid circuits)