SJ/T 11394-2009
Measure methods of semiconductor light emitting diodes (English Version)

Standard No.

SJ/T 11394-2009

Language

Chinese, Available in English version

Release Date

2009

Published By

Professional Standard - Electron

Latest

SJ/T 11394-2009

Replace

SJ 2355.7-1983 SJ 2355.6-1983 SJ 2355.5-1983 SJ 2355.4-1983 SJ 2355.3-1983 SJ 2355.2-1983 SJ 2355.1-1983

SJ/T 11394-2009 Referenced Document

• CIE 127-1997 Measurement of LEDs
• GB/T 11499-2001 Letter symbols for discrete semiconductor devices
• GB/T 15651-1995 Semiconductor devices. Discrete devices and integrated circuits. Part 5: Optoelectronic devices
• GB/T 4365-2003 Electrotechnical terminology Electromagnetic compatibility
• GB/T 5698-2001 Glossary of color terms
• GB/T 5702-2003 Methods of measuring the color of light sources
• GB/T 7921-1997 Uniform colour space and colour difference formula
• GB/T 7922-2003 Method of measuring the color of light sources

SJ/T 11394-2009 history

• 2009 SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes
• 1983 SJ 2355.1-1983 General procedures of measurement for light-emitting deivces

SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes has been changed from SJ 2355.7-1983 Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices.

SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes has been changed from SJ 2355.6-1983 Method of measurement for luminous flux of light-emitting devices.

SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes has been changed from SJ 2355.5-1983 Method of measurement for luminous intensity and half-intensity angle of light-emitting devices.

SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes has been changed from SJ 2355.4-1983 Methods of measurement for junction capacitance of light-emitting devices.

SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes has been changed from SJ 2355.3-1983 Method of measurement for reverse current of light-emitting devices.

SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes has been changed from SJ 2355.2-1983 Method of measurement for forward voltage drop of light-emitting devices.

SJ/T 11394-2009 Measure methods of semiconductor light emitting diodes has been changed from SJ 2355.1-1983 General procedures of measurement for light-emitting deivces.