ZH
RU
ES
Minor defect
Minor defect, Total:69 items.
In the international standard classification, Minor defect involves: Fibre optic communications, Welding, brazing and soldering, Analytical chemistry, Electricity. Magnetism. Electrical and magnetic measurements, Telecommunication systems, Medical equipment, Power stations in general, Non-destructive testing, Bridge construction, Electromechanical components for electronic and telecommunications equipment, Biology. Botany. Zoology, Testing of metals, Powder metallurgy, Plastics, Semiconducting materials, Organic chemicals, Pesticides and other agrochemicals, Microbiology, Cereals, pulses and derived products, Tea. Coffee. Cocoa, Sugar. Sugar products. Starch, Chocolate, Fruits. Vegetables, Meat, meat products and other animal produce, Construction materials.
TIA - Telecommunications Industry Association, Minor defect
American National Standards Institute （ANSI), Minor defect
International Organization for Standardization (ISO), Minor defect
- ISO 5817:1992 Arc-welded joints in steel; guidance on quality levels for imperfections
- ISO 5817:2023 Welding — Fusion-welded joints in steel, nickel, titanium and their alloys (beam welding excluded) — Quality levels for imperfections
- ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- ISO 4499-4:2016 Hardmetals - Metallographic determination of microstructure - Part 4: Characterisation of porosity, carbon defects and eta-phase content
- ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
- ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
Professional Standard - Electron, Minor defect
- SJ 20843-2002 Quantitative determination of AB microscopic defect density in gallium arsenide single crystal
NL-NEN, Minor defect
- NEN-ISO 5817:1993 Arc-welded joints in steel. Guidance on quality levels for imperfections (ISO 5817:1992)
RU-GOST R, Minor defect
- GOST R ISO 10042-2009 Welding. Arc-welding joints in aluminium and its alloys. Quality levels for imperfections
- GOST R ISO 5817-2021 Welding. Fusion-welded joints in steel, nickel, titanium and their alloys (beam welding excluded). Quality levels
- GOST R ISO 5817-2009 Welding. Fusion-welded joints in steel, nickel, titanium and their alloys (beam welding excluded). Quality levels for imperfections
- GOST 33536-2015 Confectionery. Method for quantity determination of mesophilic aerobic and facultative-anaerobic microorganisms
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Minor defect
- GB/T 5832.2-1986 Determination of trace water in the gases--Dew point method
- GB/T 26834-2011 Non-destructive testing instruments.Measurement of effective focal spot size of mini and micro focus X-ray tubes
- GB/T 28634-2012 Microbeam analysis.Electron probe microanalysis.Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
- GB/T 5832.2-2008 Determination of moisture in gases.Part 2: Dew point method
- GB/T 11060.4-2010(俄语版) Part 4: Determination of point sulfur content by oxidative microcoulometry
- GB/T 25758.5-2010 Non-destructive testing.Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing.Part 5: Measurement of the effective focal spot size of mini and micro focus X-ray tubes
- GB/T 4120.5-1992 Liquid chlorinated methanes for industrial use--Determination of micro-amounts of water(cloud point method)
- GB/T 29567-2013 The bioassay method for flies'resistance to insecticides.Topical application method
Professional Standard - Post and Telecommunication, Minor defect
- YD/T 746-1995 Technical requirement and measuring method for point-to-multipoint microwave communication systems
American Society for Testing and Materials (ASTM), Minor defect
- ASTM E2903-18 Standard Test Method for Measurement of the Effective Focal Spot Size of Mini and Micro Focus X-ray Tubes
- ASTM E2903-13 Standard Test Method for Measurement of the Effective Focal Spot Size of Mini and Micro Focus X-ray Tubes
- ASTM C1356-96(2001) Standard Test Method for Quantitative Determination of Phases in Portland Cement Clinker by Microscopical Point-Count Procedure
- ASTM C1356-07(2020) Standard Test Method for Quantitative Determination of Phases in Portland Cement Clinker by Microscopical Point-Count Procedure
- ASTM C1356-07 Standard Test Method for Quantitative Determination of Phases in Portland Cement Clinker by Microscopical Point-Count Procedure
- ASTM C1356-07(2012) Standard Test Method for Quantitative Determination of Phases in Portland Cement Clinker by Microscopical Point-Count Procedure
CZ-CSN, Minor defect
- CSN 25 1234-1974 Vernier callipers with fine adjustment and points for external measurements
- CSN 25 1234-1985 Vernier callipers with fine adjustment and with point for external measurements. Dimensions
Professional Standard - Electricity, Minor defect
- DL/T 1354-2014 The method of flash point of power oil by microscale continuously closed cup tester
British Standards Institution (BSI), Minor defect
- BS EN ISO 5817:2003 Welding - Fusion-welded joints in steel, nickel, titanium and their alloys (beam welding excluded) - Quality levels for imperfections
- BS EN 60512-16-18:2008 Connectors for electronic equipment - Tests and measurements - Part 16-18: Mechanical tests on contacts
and terminations — Test 16r: Deflection
of contacts, simulation
- BS EN ISO 4499-4:2016 Hardmetals. Metallographic determination of microstructure. Characterisation of porosity, carbon defects and eta-phase content
- BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
- BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
- BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- BS EN 12543-5:1999 Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Measurement of the effective focal spot size of mini and micro focus X-ray tubes
- 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
Professional Standard - Aviation, Minor defect
- HB 466-1965 Standards for quality inspection and defect repair of resistance spot and seam welding of wrought aluminum alloys
Group Standards of the People's Republic of China, Minor defect
- T/GDSZ 001-2023 Technical specification for quality detecting and defect strengthening of connecting nodes of prefabricated municipal bridge
- T/IAWBS 012-2019 Test Method for Surface Quality and Micropipe?Density?of Silicon Carbide?Single Crystal?Polishing Wafers——Confocal and Differential Interferometry Optics
HU-MSZT, Minor defect
German Institute for Standardization, Minor defect
- DIN EN 12543-5:1999-12 Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 5: Measurement of the effective focal spot size of mini and micro focus X-ray tubes; German version EN 12543-5:1999
- DIN EN ISO 4499-4:2016-10 Hardmetals - Metallographic determination of microstructure - Part 4: Characterisation of porosity, carbon defects and eta-phase content (ISO 4499-4:2016); German version EN ISO 4499-4:2016
- DIN EN ISO 4499-4:2016 Hardmetals - Metallographic determination of microstructure - Part 4: Characterisation of porosity, carbon defects and eta-phase content (ISO 4499-4:2016); German version EN ISO 4499-4:2016
Jiangxi Provincial Standard of the People's Republic of China, Minor defect
- DB36/T 1662-2022 Quantum dot microsphere immunochromatographic test strip evaluation technical specification
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Minor defect
Korean Agency for Technology and Standards (KATS), Minor defect
- KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
- KS I 2207-2009 Testing methods for determination of trace components in diluent gas and zero gas
KR-KS, Minor defect
- KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
- KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
Association Francaise de Normalisation, Minor defect
- NF EN 12543-5:1999 Essais non destructifs - Caractéristiques des foyers émissifs des tubes radiogènes industriels utilisés dans les essais non destructifs - Partie 5 : mesure de la dimension du foyer émissif de tubes radiogènes à mini et microfoyer
- NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
- NF A95-186-4*NF EN ISO 4499-4:2017 Hardmetals - Metallographic determination of microstructure - Part 4 : characterisation of porosity, carbon defects and eta-phase content
- NF EN ISO 4499-4:2017 Métaux-durs - Détermination métallographique de la microstructure - Partie 4 : caractérisation de la porosité, des défauts carbone et de la teneur en phase êta
International Electrotechnical Commission (IEC), Minor defect
- IEC 60512-16-18:2008 Connectors for electronic equipment - Tests and measurements - Part 16-18: Mechanical tests on contacts and terminations - Test 16r: Deflection of contacts, simulation
ES-UNE, Minor defect
- UNE-EN ISO 4499-4:2016 Hardmetals - Metallographic determination of microstructure - Part 4: Characterisation of porosity, carbon defects and eta-phase content (ISO 4499-4:2016)
FI-SFS, Minor defect
Japanese Industrial Standards Committee (JISC), Minor defect
- JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
江西省市场监督管理局, Minor defect
- DB36/Z 001-2022 Detection of Carbofuran in Vegetables and Fruits Quantum Dot Microsphere Fluorescence Immunochromatography
- DB36/Z 002-2022 Quantum dot microsphere fluorescence immunochromatography for detection of amantadine in animal-derived foods
Lithuanian Standards Office , Minor defect
- LST EN 12543-5-2001 Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 5: Measurement of the effective focal spot size of mini and micro focus X-ray tubes
European Committee for Standardization (CEN), Minor defect
- EN ISO 4499-4:2016 Hardmetals - Metallographic determination of microstructure - Part 4: Characterisation of porosity@ carbon defects and eta-phase content
SE-SIS, Minor defect
- SIS SS-ISO 8514-1:1992 Micrographics — Alphanumeric computer out- put microforms — Quality control — Part 1 : Characteristics of the test slide and test data
PL-PKN, Minor defect
- PN C99265-04-1986 Light sensitive materials for reprography Qualitative and usable characteristic for black-and-white negative and positive films for microfilm copying
ES-AENOR, Minor defect