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scanning electron microscope
scanning electron microscope, Total:18 items.
In the international standard classification, scanning electron microscope involves: Optical equipment, Optics and optical measurements, Air quality, Education.
British Standards Institution (BSI), scanning electron microscope
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
Japanese Industrial Standards Committee (JISC), scanning electron microscope
Professional Standard - Commodity Inspection, scanning electron microscope
- SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy
International Organization for Standardization (ISO), scanning electron microscope
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
National Metrological Technical Specifications of the People's Republic of China, scanning electron microscope
- JJF 1916-2021 Calibration Specification for Scanning Electronic Microscopes (SEM)
Professional Standard - Machinery, scanning electron microscope
National Metrological Verification Regulations of the People's Republic of China, scanning electron microscope
- JJG(教委) 11-1992 Scanning Electron Microscope Calibration Regulations
- JJG 550-1988 Verification Regulation of Scanning Electron Microscope
Korean Agency for Technology and Standards (KATS), scanning electron microscope
American Society for Testing and Materials (ASTM), scanning electron microscope
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
KR-KS, scanning electron microscope
Professional Standard - Education, scanning electron microscope
- JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy