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Thermal Resistance Test Method

Thermal Resistance Test Method, Total:11 items.

In the international standard classification, Thermal Resistance Test Method involves: Semiconductor devices, Mechanical structures for electronic equipment, Protective equipment, Rectifiers. Convertors. Stabilized power supply, Integrated circuits. Microelectronics, Lamps and related equipment, Resistors.

Group Standards of the People's Republic of China, Thermal Resistance Test Method

• T/CIE 121-2021 Thermal resistance test method of reverse conduction IGBT
• T/CSA 047-2019 Measurement Method for Real Thermal Resistance and Impedance of Light Emitting Diodes

Professional Standard - Electron, Thermal Resistance Test Method

• SJ 2242-1982 Thermal resistance measurements for forced-air cooled heat sinks
• SJ 20787-2000 Measurment method for thermal resistance of semiconductor bridge rectifieres
• SJ 1267-1977 Thermal resistance measurements of sinks for semiconductor devices under natural air cooling conditions
• SJ 20788-2000 Measurment method for thermal impedance of semiconductor diodes

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Thermal Resistance Test Method

• GB/T 18398-2001 Testing method for clothing thermal resistance--Thermal manikin method
• GB/T 14862-1993 Junction-to-case thermal resistance test methods of packages for semiconductor integrated circuits

Korean Agency for Technology and Standards (KATS), Thermal Resistance Test Method

• KS C 2711-2001 Test method for PTC thermistors
• KS C 2711-2003 Test method for PTC thermistors

Guizhou Provincial Standard of the People's Republic of China, Thermal Resistance Test Method

• DB52/T 1104-2016 Transient test method for junction-case thermal resistance of semiconductor devices

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